Name
Title | ||
|---|---|---|
Fortuitous Detection and its Impact on Test Set Sizes Using Stuck-at and Transition Faults |
Abstract | ||
|---|---|---|
During manufacture testing, the maximum number of test patterns that can be applied is limitedby the available amount of tester memory. This paper investigates the effect that the probability of fortuitous detection has on test pattern length when stuck-at and transition faults are targeted in four benchmark circuits. We will show the magnitude of the increase in test pattern length that occurs when transition faults are targeted, and this will indicate that current test pattern generation methods are not adequate to make multiple detections of timing faults practical for most circuits. |
Year | DOI | Venue |
|---|---|---|
2002 | 10.1109/DFTVS.2002.1173514 | DFT |
Keywords | Field | DocType |
current test pattern generation,transition faults,fortuitous detection,test pattern length,test pattern,manufacture testing,benchmark circuit,transition fault,available amount,maximum number,multiple detection,test set,benchmark testing,manufacturing,probability,fault detection,automatic test pattern generation,system testing | Automatic test pattern generation,Magnitude (mathematics),Computer science,System testing,Fault detection and isolation,Electronic engineering,Real-time computing,Test compression,Electronic circuit,Benchmark (computing),Test set | Conference |
ISSN | ISBN | Citations |
1550-5774 | 0-7695-1831-1 | 4 |
PageRank | References | Authors |
0.56 | 0 | 6 |
Name | Order | Citations | PageRank |
|---|---|---|---|
| Jennifer Dworak | 1 | 132 | 11.63 |
| James Wingfield | 2 | 4 | 0.56 |
| Brad Cobb | 3 | 4 | 0.56 |
| Sooryong Lee | 4 | 87 | 7.63 |
| Li-C. Wang | 5 | 527 | 50.67 |
| M. Ray Mercer | 6 | 679 | 108.73 |