Paper Info
Title
Effective IR-drop reduction in at-speed scan testing using Distribution-Controlling X-Identification
Abstract
Test data modification based on test relaxation and X-filling is the preferable approach for reducing excessive IR-drop in at-speed scan testing to avoid test-induced yield loss. However, none of the existing test relaxation methods can control the distribution of identified don't care bits (X-bits), thus adversely affecting the effectiveness of IR-drop reduction. In this paper, we propose a novel test relaxation method, called Distribution-Controlling X-Identification (DC-XID), which controls the distribution of X-bits identified from a set of fully-specified test vectors for the purpose of effectively reducing IR-drop. Experimental results on large industrial circuits demonstrate the effectiveness and practicality of the proposed method in reducing IR-drop, without any impact on fault coverage, test data volume, or test circuit size.
Year
DOI
Venue
2008
10.1109/ICCAD.2008.4681551
San Jose, CA
Keywords
Field
DocType
excessive ir-drop,novel test relaxation method,effective ir-drop reduction,existing test relaxation method,test data modification,test data volume,ir-drop reduction,test relaxation,fully-specified test vector,distribution-controlling x-identification,test circuit size,testing,logic gates,fault coverage,switches
Automatic test pattern generation,Logic gate,Power network design,Fault coverage,Computer science,Relaxation (iterative method),Real-time computing,Electronic engineering,Test data,Electronic circuit,Test compression
Conference
ISSN
ISBN
Citations 
1092-3152 E-ISBN : 978-1-4244-2820-5
978-1-4244-2820-5
16
PageRank 
References 
Authors
0.80
20
9
Name
Order
Citations
PageRank
Kohei Miyase156238.71
Kenji Noda2302.91
Hideaki Ito3252.02
Kazumi Hatayama414116.66
Takashi Aikyo59311.46
Yuta Yamato61389.45
Hiroshi Furukawa7223.63
Xiaoqing Wen879077.12
Seiji Kajihara998973.60