Name
Title | ||
|---|---|---|
Two-Stage Stuck-at Fault Test Data Compression Using Scan Flip-Flops with Delay Fault Testability. |
Year | DOI | Venue |
|---|---|---|
2008 | 10.2197/ipsjtsldm.1.91 | IPSJ T. on System LSI Design Methodology |
Field | DocType | Volume |
Testability,Stuck-at fault,Compression (physics),FLOPS,Computer science,Test data compression,Huffman coding,Test data,Computer hardware,Test compression | Journal | 1 |
Citations | PageRank | References |
0 | 0.34 | 9 |
Authors | ||
3 | ||
Name | Order | Citations | PageRank |
|---|---|---|---|
| Kentaroh Katoh | 1 | 34 | 6.64 |
| Kazuteru Namba | 2 | 114 | 27.93 |
| Hideo Ito | 3 | 100 | 17.45 |