Name
Abstract | ||
|---|---|---|
Recent studies show that a stuck-at test applied at the operational speed of the circuit identifies more defective chips than a test having the same fault coverage but applied at a lower speed. Design-for-testability approaches based on full scan, partial scan, or silicon-based solutions such as CrossCheck achieve very high stuck-at fault coverage. However, in all these cases, the tests have to be applied at speeds lower than the operation speed. In this work, we investigate various design-for-testability (DFT) techniques for sequential circuits that permit at-speed application of tests while providing for very high fault coverage. The method involves parallel loading of flip-flops in test mode for enhanced controllability combined with probe point insertion for enhanced observability. Fault coverage and ATG effectiveness improved to greater than 96% and 99.7%, respectively, for the ISCAS89 sequential benchmark circuits studied when these nonscan DFT techniques were used. The average area overhead for the nonscan DFT enhancements was 9.9% for standard cell implementations of three circuits synthesized from high-level descriptions, compared to 20.2% for full scan. ATG effectiveness improved to greater than 99.3% for all three circuits with the nonscan DFT enhancements. |
Year | DOI | Venue |
|---|---|---|
1995 | 10.1109/92.386233 | IEEE Trans. VLSI Syst. |
Keywords | Field | DocType |
nonscan approach,high stuck-at fault coverage,lower speed,high fault coverage,atg effectiveness,operational speed,operation speed,stuck-at test,nonscan dft technique,nonscan dft enhancement,sequential circuit testability enhancement,fault coverage,integrated circuit design,sequential circuits,sequential analysis,logic design,observability,controllability,design for testability,chip | Design for testing,Logic synthesis,Testability,Sequential logic,Fault coverage,Computer science,Real-time computing,Electronic engineering,Integrated circuit design,Standard cell,Electronic circuit | Journal |
Volume | Issue | ISSN |
3 | 2 | 1063-8210 |
Citations | PageRank | References |
7 | 0.53 | 11 |
Authors | ||
4 | ||
Name | Order | Citations | PageRank |
|---|---|---|---|
| Elizabeth M. Rudnick | 1 | 867 | 76.37 |
| Vivek Chickermane | 2 | 289 | 21.60 |
| Prithviraj Banerjee | 3 | 2763 | 337.99 |
| J. H. Patel | 4 | 4577 | 527.59 |