Name
Abstract | ||
|---|---|---|
This paper presents a BIST scheme for the structural testing of pipelined ADCs. The operational principle relies on testing every ADC stage reconfigured as an A/D-D/A block and applying as input a set of analog DC values. These values have been determined as the appropriate and simple stimuli giving a single output signature. A new output signature is proposed allowing a low-cost digital domain test evaluation. The new technique is intended to be used in pipelined converters of an arbitrary number of conversion stages and provided with a digital correction mechanism. |
Year | DOI | Venue |
|---|---|---|
2001 | 10.1109/VTS.2001.923450 | Marina Del Rey, CA |
Keywords | DocType | ISSN |
self-testable pipelined adc,structural testing,new output signature,bist scheme,pipelined converter,single output signature,pipelined adcs,low-cost digital domain test,digital correction mechanism,adc stage,low hardware overhead,new technique,testing,hardware,manufacturing industries,microelectronics,production | Conference | 1093-0167 |
ISBN | Citations | PageRank |
0-7695-1122-8 | 1 | 0.43 |
References | Authors | |
0 | 4 | |
Name | Order | Citations | PageRank |
|---|---|---|---|
| Eduardo J. Peralías | 1 | 58 | 16.71 |
| Gloria Huertas | 2 | 74 | 13.29 |
| Adoración Rueda | 3 | 275 | 40.01 |
| José L. Huertas | 4 | 159 | 18.91 |