Name
Year | DOI | Venue |
|---|---|---|
1993 | 10.1109/DFTVS.1993.595827 | DFT |
Keywords | Field | DocType |
cmos analog building blocks,realistic fault analysis,functional test,functional testing,circuit analysis,integrated circuit,quality improvement,design for testability,cmos integrated circuits | Design for testing,Automatic test pattern generation,Fault analysis,Computer science,Test quality,CMOS,Electronic engineering,Parametric statistics,Network analysis,Integrated circuit,Reliability engineering | Conference |
ISBN | Citations | PageRank |
0-8186-3502-9 | 1 | 0.41 |
References | Authors | |
8 | 6 | |
Name | Order | Citations | PageRank |
|---|---|---|---|
| P. Nicolau | 1 | 1 | 0.41 |
| J. Barbosa | 2 | 1 | 0.75 |
| M. Saraiva | 3 | 19 | 1.93 |
| Marcelino B. Santos | 4 | 129 | 20.76 |
| Isabel Teixeira | 5 | 59 | 6.03 |
| João Paulo Teixeira | 6 | 140 | 22.06 |