Title
A hierarchical generic approach for on-chip communication, testing and debugging of SoCs
Abstract
This paper presents a new generic system architecture and design methodology for the design, debugging and testing of complex systems-on-chip (SoC). Starting from a hierarchical generic system architecture, platforms for dedicated application scenarios will be customized. In order to be able to handle very complex submicron designs, the system is based on a globally asynchronous and locally synchronous (GALS) concept. The problem of the increasing functionality versus outer access capabilities ratio is faced by novel embedded and combined debugging and test structures. The integration of debugging possibilities is essential for an efficient co-design of SoC integrated hardware and software, especially for systems with integrated reconfigurable hardware parts.
Year
DOI
Venue
2003
10.1007/0-387-33403-3_3
VLSI-SOC
Keywords
DocType
Citations 
built-in self test,sihcon debug,networks-on-chip
Conference
4
PageRank 
References 
Authors
0.49
7
6
Name
Order
Citations
PageRank
Thomas Hollstein116121.88
Ralf Ludewig2123.56
Christoph Mager340.49
Peter Zipf418645.00
Manfred Glesner51121255.04
Manfred Glesner618236.92