Name
Abstract | ||
|---|---|---|
This paper presents a diagnostic test generation method for transition faults. As two consecutive vectors application mechanism, launch on capture test is considered. The proposed algorithm generates test vectors for given fault pairs using a stuck-at ATPG tool so that they are distinguished. If a given fault pair is indistinguishable, it is identified. Therefore the proposed algorithm provides a complete test generation regarding the distinguishability. The conditions for distinguishing a fault pair are carefully considered, and they are transformed into the conditions of the detection of a stuck-at fault, and some additional logic are inserted in a CUT for the test generation. Experimental results show that the proposed method can generate test vectors for distinguishing the fault pairs that are not distinguished by commercial tools, and also identify all the indistinguishable fault pairs. |
Year | DOI | Venue |
|---|---|---|
2009 | 10.1109/TEST.2009.5355681 | ITC: 2009 INTERNATIONAL TEST CONFERENCE |
Keywords | Field | DocType |
Fault diagnosis, Test generation, Transition faults, Stuck-at ATPG | Stuck-at fault,Automatic test pattern generation,Logic gate,Algorithm design,Fault coverage,Diagnostic test,Computer science,Algorithm,Electronic engineering | Conference |
ISSN | Citations | PageRank |
1089-3539 | 13 | 0.66 |
References | Authors | |
12 | 8 | |
Name | Order | Citations | PageRank |
|---|---|---|---|
| Yoshinobu Higami | 1 | 140 | 27.24 |
| Yosuke Kurose | 2 | 13 | 0.66 |
| Satoshi Ohno | 3 | 20 | 2.69 |
| Hironori Yamaoka | 4 | 14 | 1.02 |
| Hiroshi Takahashi | 5 | 148 | 24.32 |
| Yoshihiro Shimizu | 6 | 14 | 1.02 |
| Takashi Aikyo | 7 | 93 | 11.46 |
| Yuzo Takamatsu | 8 | 150 | 27.40 |