Abstract | ||
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Previous studies on nanomanipulation using Atomic Force Microscope (AFM) go through the scan-design-manipulation-scan cycle, in which an operator does not have any real-time visual feedback during manipulation. In this paper, a simple model of tip-substrate-object interactive forces has been presented for the qualitative and quantitative analysis. Based on this model, the real-time tip-substrate-object interactive forces are used to update the AFM images in order to provide the operator with real-time visual feedback. The real-time visual display combining with real-time force feedback provides an augmented reality environment, in which the operator not only can feel the real-time 3-D interaction forces but also observe the real-time changes of the nano-environment. |
Year | DOI | Venue |
---|---|---|
2003 | 10.1109/IROS.2003.1249185 | IROS 2003: PROCEEDINGS OF THE 2003 IEEE/RSJ INTERNATIONAL CONFERENCE ON INTELLIGENT ROBOTS AND SYSTEMS, VOLS 1-4 |
Keywords | Field | DocType |
force feedback,virtual reality,real time,atomic force microscope,atomic force microscopy,augmented reality | Computer vision,Virtual reality,Atomic force microscopy,Computer graphics (images),Computer science,Augmented reality,Artificial intelligence,Operator (computer programming),Interaction forces,Haptic technology | Conference |
Citations | PageRank | References |
7 | 1.32 | 3 |
Authors | ||
4 |
Name | Order | Citations | PageRank |
---|---|---|---|
Guangyong Li | 1 | 95 | 17.92 |
Ning Xi | 2 | 1422 | 228.89 |
Mengmeng Yu | 3 | 35 | 6.54 |
Wai-keung Fung | 4 | 92 | 15.24 |