Paper Info
Title
Dynamic Test Set Selection Using Implication-Based On-Chip Diagnosis
Abstract
We propose using logic implications as a source of online diagnostic data for on-chip test set selection by taking advantage of their ability to automatically identify a restricted set of faults as the potential cause of an observed error. This information will be used to dynamically choose a test set to detect systematic latent defects or wear out in a multi core system.
Year
DOI
Venue
2011
10.1109/ETS.2011.59
European Test Symposium
Keywords
Field
DocType
potential cause,multi core system,on-chip test set selection,implication-based on-chip diagnosis,online diagnostic data,restricted set,systematic latent defect,observed error,dynamic test set selection,logic implication,multicore processing,system on a chip,systematics,hardware,dynamic testing,electrical engineering,system on chip,error detection,chip
System on a chip,Computer science,Real-time computing,Error detection and correction,Dynamic testing,Multi-core processor,Embedded system,Test set
Conference
ISSN
ISBN
Citations 
1530-1877 E-ISBN : 978-0-7695-4433-5
978-0-7695-4433-5
2
PageRank 
References 
Authors
0.37
20
6
Name
Order
Citations
PageRank
N. Alves160.78
Y. Shi220.37
N. Imbriglia320.37
Jennifer Dworak413211.63
K. Nepal59610.42
R. Iris Bahar687884.31