Title
A comparison of post-processing techniques for biased random number generators
Abstract
In this paper, we study and compare two popular methods for post-processing random number generators: linear and Von Neumann compression. We show that linear compression can achieve much better throughput than Von Neumann compression, while achieving practically good level of security. We also introduce a concept known as the adversary bias which measures how accurately an adversary can guess the output of a random number generator, e.g. through a trapdoor or a bad RNG design. Then we prove that linear compression performs much better than Von Neumann compression when correcting adversary bias. Finally, we discuss on good ways to implement this linear compression in hardware and give a field-programmable gate array (FPGA) implementation to provide resource utilization estimates.
Year
DOI
Venue
2011
10.1007/978-3-642-21040-2_12
WISTP
Keywords
Field
DocType
von neumann compression,field-programmable gate array,bad rng design,better throughput,linear compression,adversary bias,popular method,random number generator,post-processing technique,good way,good level,post processing,random number generators,entropy,bias
Computer science,Field-programmable gate array,Algorithm,Gate array,Adversary,Throughput,Random number generation,Von Neumann architecture,Pseudorandom number generator
Conference
Volume
ISSN
Citations 
6633
0302-9743
13
PageRank 
References 
Authors
0.92
6
6
Name
Order
Citations
PageRank
Siew-Hwee Kwok1130.92
Yen-Ling Ee2130.92
Guanhan Chew3252.92
Kanghong Zheng4130.92
Khoongming Khoo525023.29
Chik How Tan649954.60