Name
Title | ||
|---|---|---|
On the superiority of DO-RE-ME/MPG-D over stuck-at-based defective part level prediction |
Abstract | ||
|---|---|---|
Uses data collected from benchmark circuit simulations to examine the relationship between the tests which detect stuck-at faults and those which detect bridging surrogates. We show that the coefficient of correlation between these tests approaches zero as the stuck-at fault coverage approaches 100%. An enhanced version of the MPG-D model, which is based upon the number of detections of each site in a logic circuit, is shown to be superior to stuck-at fault coverage-based defective part level prediction. We then compare the accuracy of both predictors for an industrial circuit tested using two different test pattern sequences. |
Year | DOI | Venue |
|---|---|---|
2000 | 10.1109/ATS.2000.893618 | Asian Test Symposium |
Keywords | Field | DocType |
stuck-at fault coverage approach,different test pattern sequence,mpg-d model,stuck-at fault,enhanced version,industrial circuit,stuck-at-based defective part level,logic circuit,benchmark circuit simulation,defective part level prediction,logic circuits,fault coverage,benchmark testing,atpg,pattern analysis,automatic test pattern generation,fault detection,data collection,predictive models | Correlation coefficient,Automatic test pattern generation,Logic gate,Fault coverage,Computer science,Fault detection and isolation,Bridging (networking),Real-time computing,Electronic engineering,Correlation,Benchmark (computing) | Conference |
ISBN | Citations | PageRank |
0-7695-0887-1 | 4 | 0.63 |
References | Authors | |
10 | 6 | |
Name | Order | Citations | PageRank |
|---|---|---|---|
| Jennifer Dworak | 1 | 132 | 11.63 |
| Michael R. Grimaila | 2 | 264 | 29.53 |
| B. Cobb | 3 | 4 | 0.63 |
| T. -C. Wang | 4 | 4 | 0.63 |
| Li-C. Wang | 5 | 527 | 50.67 |
| M. R. Mercer | 6 | 353 | 47.36 |