Title
Analog decoder performance degradation due to BJTs' parasitic elements
Abstract
This paper presents the effect of bipolar junction transistors' (BJTs) parasitic elements on the decoding performance of a BiCMOS analog decoder. The transistors' parasitic effects are taken into account to develop a more accurate behavioral model of the computing nodes. The model is applied to double-binary 0.25-µm BiCMOS analog decoders. Behavioral simulations show that the BJTs' parasitic elements deteriorate the error-correcting performance of a stand-alone a posteriori probability (APP) decoder by 0.5 dB compared with the ideal bit error rate (BER). In a turbo scheme, the loss is reduced to 0.2 dB for a BER that is smaller than 10-2. A simple solution based on an nMOS amplifier is proposed to counterbalance the dominant parasitic element. The amplifier reduces the degradation by 0.2 dB for the APP decoder. However, the turbo decoder is improved only for a BER above 10-2.
Year
DOI
Venue
2009
10.1109/TCSI.2009.2015727
Circuits and Systems I: Regular Papers, IEEE Transactions
Keywords
Field
DocType
decoding performance,behavioral simulation,bicmos analog decoder,m bicmos analog decoder,dominant parasitic element,analog decoder performance degradation,turbo decoder,app decoder,accurate behavioral model,parasitic element,parasitic effect,bjt,decoding,communication channels,error correction,computational modeling,behavioral modeling,degradation,bicmos,helium,behavior modeling,electronic circuits,bit error rate
Turbo,Parasitic element,BiCMOS,NMOS logic,Computer science,Electronic engineering,Bipolar junction transistor,Electronic circuit,Electrical engineering,Amplifier,Bit error rate
Journal
Volume
Issue
ISSN
56
11
1549-8328
Citations 
PageRank 
References 
1
0.35
11
Authors
4
Name
Order
Citations
PageRank
Nicolas Duchaux110.35
Cyril Lahuec2299.17
Matthieu Arzel36915.10
Fabrice Seguin43616.02