Title | ||
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A signal theory based approach to the statistical analysis of combinatorial nanoelectronic circuits |
Abstract | ||
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In this paper we present a method which allows the statistical analysis of nanoelectronic Boolean networks with respect to timing uncertainty and noise. All signals are considered to be instationary random processes which is the most general signal representation. As one cannot deal with random processes per se, we focus on certain statistical properties which are propagated through networks of Boolean gates yielding the instationary probability density function (pdf) of each signal in the network. Finally, several values of interest as the error probability, the average path delay or the average signal trace over time can be extracted from these pdf. |
Year | DOI | Venue |
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2006 | 10.1109/DATE.2006.244009 | Design, Automation and Test in Europe, 2006. DATE '06. Proceedings |
Keywords | Field | DocType |
random process,boolean gate,error probability,average path delay,nanoelectronic boolean network,certain statistical property,statistical analysis,general signal representation,instationary probability density function,average signal trace,signal theory,combinatorial nanoelectronic circuit,instationary random process,statistics,probability density function,noise,random processes,combinational circuits,boolean network,uncertainty,signal processing,stochastic processes | Signal theory,Signal trace,Computer science,Parallel computing,Algorithm,Path delay,Stochastic process,Theoretical computer science,Combinational logic,Nanoelectronic circuits,Probability density function,Statistical analysis | Conference |
Volume | ISSN | ISBN |
1 | 1530-1591 | 3-9810801-0-6 |
Citations | PageRank | References |
0 | 0.34 | 5 |
Authors | ||
4 |
Name | Order | Citations | PageRank |
---|---|---|---|
Oliver Soffke | 1 | 6 | 3.63 |
Peter Zipf | 2 | 186 | 45.00 |
Tudor Murgan | 3 | 49 | 9.74 |
Manfred Glesner | 4 | 1121 | 255.04 |