Name
Abstract | ||
|---|---|---|
Testing plays an important role in controlling and ensuring required quality and reliability of manufactured integrated circuits (ICs) before supplying them to final users. Several types of testing are performed at different stages of the IC manufacturing process. One of them is the so-called burn-in testing (i.e., accelerated testing performed under elevated temperature and other stress condition... |
Year | DOI | Venue |
|---|---|---|
2007 | 10.1109/TIM.2007.894165 | IEEE Transactions on Instrumentation and Measurement |
Keywords | DocType | Volume |
Statistical analysis,Circuit testing,Integrated circuit testing,Performance evaluation,Manufacturing processes,Stress,Integrated circuit reliability,Integrated circuit manufacture,Life estimation,Temperature | Journal | 56 |
Issue | ISSN | Citations |
3 | 0018-9456 | 7 |
PageRank | References | Authors |
0.84 | 2 | 3 |
Name | Order | Citations | PageRank |
|---|---|---|---|
| Melanie Po-Leen Ooi | 1 | 70 | 18.35 |
| Zainal Abu Kassim | 2 | 24 | 2.24 |
| Serge N. Demidenko | 3 | 84 | 19.38 |