Author Info
Name
Affiliation
Papers
ZAINAL ABU KASSIM
Freescale Semiconductor, Selangor, Malaysia
3
Collaborators
Citations 
PageRank 
7
24
2.24
Referers 
Referees 
References 
66
8
4
Title
Citations
PageRank
Year
Shortening Burn-In Test: Application of HVST and Weibull Statistical Analysis70.842007
Reducing Burn-in Time through High-Voltage Stress Test and Weibull Statistical Analysis171.072006
Shortening Burn-In Test: Application of a Novel Approach in optimizing Burn-In Time using Weibull Statistical Analysis with HVST00.342005