Paper Info
Title
Unknown-tolerance analysis and test-quality control for test response compaction using space compactors
Abstract
For a space compactor, degradation of fault detection capability caused by the masking effects from unknown values is much more serious than that caused by error masking (i.e. aliasing). In this paper, we first propose a mathematical framework to estimate the percentage of observable responses under unknown-induced masking for a space compactor. We further develop a prediction scheme which can correlate the percentage of observable responses with the modeled-fault coverage and with a n-detection metric for a given test set. As a result, the quality of a space compactor can be measured directly based on its test quality, instead of based on indirect metrics such as the number of tolerated unknowns or the aliasing probability. With the prediction scheme above, we propose a construction flow for space compactors to achieve the desired level of test quality while maximizing the compaction ratio.
Year
DOI
Venue
2006
10.1145/1146909.1147183
DAC
Keywords
Field
DocType
observable response,prediction scheme,unknown-induced masking,aliasing probability,test quality,unknown-tolerance analysis,test-quality control,test set,error masking,space compactors,test response compaction,space compactor,masking effect,fault detection,mathematical analysis,fault coverage,fault tolerance,design,design for test,quality control
Design for testing,Fault coverage,Masking (art),Fault detection and isolation,Computer science,Tolerance analysis,Real-time computing,Electronic engineering,Aliasing,Fault tolerance,Test set
Conference
ISBN
Citations 
PageRank 
1-59593-381-6
4
0.41
References 
Authors
16
5
Name
Order
Citations
PageRank
Mango C.-T. Chao1487.38
Kwang-Ting Cheng25755513.90
Seongmoon Wang360548.50
Srimat T. Chakradhar42492185.94
Wenlong Wei5816.50