Name
Title | ||
|---|---|---|
Distribution-Controlled X-Identification For Effective Reduction Of Launch-Induced Ir-Drop In At-Speed Scan Testing |
Abstract | ||
|---|---|---|
Test data modification based on test relaxation and X-filling is the preferred approach for reducing excessive IR-drop in at-speed scan testing to avoid test-induced yield loss. However, none of the existing test relaxation methods can control the distribution of identified don't care bits (X-bits), thus adversely affecting the effectiveness of IR-drop reduction. In this paper, we propose a novel test relaxation method, called Distribution-Controlled X-Identification (DC-XID), which controls the distribution of X-bits identified in a set of fully-specified test vectors for the purpose of effectively reducing IR-drop. Experiments on large industrial circuits demonstrate the effectiveness and practicality of the proposed method in reducing IR-drop, without lowering fault coverage, increasing test data volume and circuit size. |
Year | DOI | Venue |
|---|---|---|
2011 | 10.1587/transinf.E94.D.1216 | IEICE TRANSACTIONS ON INFORMATION AND SYSTEMS |
Keywords | Field | DocType |
ATPG, X-bit, X-identification, X-filling | Fault coverage,Computer science,Artificial intelligence,Real versus nominal value,Test method,Automatic test pattern generation,Power network design,Pattern recognition,Simulation,Relaxation (iterative method),Algorithm,Test data,Test compression | Journal |
Volume | Issue | ISSN |
E94D | 6 | 1745-1361 |
Citations | PageRank | References |
0 | 0.34 | 16 |
Authors | ||
9 | ||
Name | Order | Citations | PageRank |
|---|---|---|---|
| Kohei Miyase | 1 | 562 | 38.71 |
| Kenji Noda | 2 | 30 | 2.91 |
| Hideaki Ito | 3 | 25 | 2.02 |
| Kazumi Hatayama | 4 | 141 | 16.66 |
| Takashi Aikyo | 5 | 93 | 11.46 |
| Yuta Yamato | 6 | 138 | 9.45 |
| Hiroshi Furukawa | 7 | 22 | 3.63 |
| Xiaoqing Wen | 8 | 790 | 77.12 |
| Seiji Kajihara | 9 | 989 | 73.60 |