Paper Info
Title
Low-cost digital detection of parametric faults in cascaded ΣΔ modulators
Abstract
The test of ΣΔ modulators is cumbersome due to the high performance that they reach. Moreover, technology scaling trends raise serious doubts on the intradie repeatability of devices. An increase of variability will lead to an increase in parametric faults that are difficult to detect. In this paper, a design-oriented testing approach is proposed to perform a simple and low-cost detection of variations in important design variables of cascaded ΣΔ modulators. The digital tests could be integrated in a production test flow to improve fault coverage and bring data for silicon debug. A study is presented to tailor signature generation, with test-time minimization in mind, as a function of the desired measurement precision. The developments are supported by experimental results that validate the proposal.
Year
DOI
Venue
2009
10.1109/TCSI.2008.2006648
IEEE Transactions on Circuits and Systems Part I: Regular Papers
Keywords
DocType
Volume
production test flow,important design variable,low-cost digital detection,high performance,parametric fault,measurement precision,intradie repeatability,low-cost detection,experimental result,design-oriented testing approach,digital test,fault coverage
Journal
56
Issue
ISSN
Citations 
7
1549-8328
0
PageRank 
References 
Authors
0.34
4
2
Name
Order
Citations
PageRank
Gildas Léger152.67
Adoración Rueda227540.01