Name
Abstract | ||
|---|---|---|
A new experimental set-up dedicated to front side and backside picosecond OBIC testing is presented. Applications for fundamental study of integrated circuits are presented. Front side and backside OBIC images of an analog integrated circuit show the potentiality and the suitability of this new equipment an methodology for laser testing of VLSI circuits. (C) 2001 Elsevier Science Ltd. All rights reserved. |
Year | DOI | Venue |
|---|---|---|
2001 | 10.1016/S0026-2714(01)00198-6 | Microelectronics Reliability |
Field | DocType | Volume |
Electronic engineering,Engineering | Journal | 41 |
Issue | ISSN | Citations |
9 | 0026-2714 | 1 |
PageRank | References | Authors |
0.63 | 0 | 8 |
Name | Order | Citations | PageRank |
|---|---|---|---|
| D. Lewis | 1 | 21 | 9.42 |
| V. Pouget | 2 | 51 | 11.38 |
| T. Beauchêne | 3 | 3 | 2.40 |
| H. Lapuyade | 4 | 1 | 0.63 |
| Pascal Fouillat | 5 | 58 | 14.00 |
| A. Touboul | 6 | 3 | 2.03 |
| F. Beaudoin | 7 | 1 | 1.30 |
| P. Perdu | 8 | 60 | 27.38 |