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D. LEWIS
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Name
Affiliation
Papers
D. LEWIS
IXL, Université Bordeaux 1, 33405 Talence, France
14
Collaborators
Citations
PageRank
40
21
9.42
Referers
Referees
References
79
29
10
Publications (14 rows)
Collaborators (40 rows)
Referers (79 rows)
Referees (29 rows)
Title
Citations
PageRank
Year
Time resolved imaging using synchronous picosecond Photoelectric Laser Stimulation
2
0.68
2006
Application of various optical techniques for ESD defect localization
1
0.44
2006
Different Failure signatures of multiple TLP and HBM Stresses in an ESD robust protection structure
0
0.34
2005
NIR laser stimulation for dynamic timing analysis
2
0.45
2005
Impact of semiconductors material on IR Laser Stimulation signal
0
0.34
2005
From Static Thermal and Photoelectric Laser Stimulation (TLS/PLS) to Dynamic Laser Testing
2
0.72
2003
Backside Defect Localizations and Revelations Techniques on Gallium Arsenide (GaAs) Devices
0
0.34
2002
Reliability Defect Monitoring with Thermal Laser Stimulation: Biased Versus Unbiased
2
0.76
2002
Backside Hot Spot Detection Using Liquid Crystal Microscopy
0
0.34
2002
Backside Localization of Current Leakage Faults Using Thermal Laser Stimulation
3
1.05
2001
Silicon Thinning and Polishing on Packaged Devices
3
1.63
2001
Front Side and Backside OBIT Mappings applied to Single Event Transient Testing
1
0.63
2001
Theoretical Investigation of an Equivalent Laser LET
4
1.08
2001
Modeling Thermal Laser Stimulation
1
0.63
2001
1