Name
Title | ||
|---|---|---|
Series resistance and oxide thickness spread influence on Weibull breakdown distribution: New experimental correction for reliability projection improvement |
Abstract | ||
|---|---|---|
The series resistance and oxide thickness spread have been reported to have an impact on the classical oxide breakdown Weibull distributions, making the breakdown detection event doubtful and leading to erroneous reliability projection. In this context, this paper explains why the two contributions (series resistance and oxide thickness spread) do not lead to the same Weibull disturbance in the case of the time and charge to breakdown distributions. Then, a useful simple, but accurate methodology is proposed for experimental "E" model based time to breakdown correction in order to improve the reliability projection. (C) 2002 Elsevier Science Ltd. All rights reserved. |
Year | DOI | Venue |
|---|---|---|
2002 | 10.1016/S0026-2714(02)00177-4 | Microelectronics Reliability |
Keywords | Field | DocType |
series resistance | Oxide,Weibull distribution,Electronic engineering,Equivalent series resistance,Engineering,Reliability engineering | Journal |
Volume | Issue | ISSN |
42 | 9 | 0026-2714 |
Citations | PageRank | References |
0 | 0.34 | 0 |
Authors | ||
4 | ||
Name | Order | Citations | PageRank |
|---|---|---|---|
| D. Roy | 1 | 0 | 0.34 |
| S. Bruyere | 2 | 3 | 2.06 |
| E. Vincent | 3 | 37 | 16.62 |
| F. Monsieur | 4 | 17 | 12.42 |