Title
Benchmarking of Standard-Cell Based Memories in the Sub- VT Domain in 65-nm CMOS Technology.
Year
Venue
DocType
2011
IEEE J. Emerg. Sel. Topics Circuits Syst.
Journal
Volume
Issue
Citations 
1
2
0
PageRank 
References 
Authors
0.34
0
4
Name
Order
Citations
PageRank
Pascal Andreas Meinerzhagen1425.25
S. M. Yasser Sherazi2123.29
A. Burg31426126.54
Joachim Neves Rodrigues48318.00