Title | ||
---|---|---|
Benchmarking of Standard-Cell Based Memories in the Sub- VT Domain in 65-nm CMOS Technology. |
Year | Venue | DocType |
---|---|---|
2011 | IEEE J. Emerg. Sel. Topics Circuits Syst. | Journal |
Volume | Issue | Citations |
1 | 2 | 0 |
PageRank | References | Authors |
0.34 | 0 | 4 |
Name | Order | Citations | PageRank |
---|---|---|---|
Pascal Andreas Meinerzhagen | 1 | 42 | 5.25 |
S. M. Yasser Sherazi | 2 | 12 | 3.29 |
A. Burg | 3 | 1426 | 126.54 |
Joachim Neves Rodrigues | 4 | 83 | 18.00 |