Name
Abstract | ||
|---|---|---|
With the growing size of modern designs and more strict time-to-market constraints, design errors unavoidably escape pre-silicon verification and reside in silicon prototypes. As a result, silicon debug has become a necessary step in the digital integrated circuit design flow. Although embedded hardware blocks, such as scan chains and trace buffers, provide a means to acquire data of internal signals in real time for debugging, there is a relative shortage in methodologies to efficiently analyze this vast data to identify root-causes. This paper presents an automated software solution that attempts to fill-in the gap. The presented techniques automate the configuration process for trace-buffer based hardware in order to acquire helpful information for debugging the failure, and detect suspects of the failure in both the spatial and temporal domain. |
Year | DOI | Venue |
|---|---|---|
2012 | 10.1109/ASPDAC.2012.6164963 | ASP-DAC |
Keywords | Field | DocType |
silicon debug environment,configuration process,circuit analysis computing,automated data analysis technique,silicon,integrated circuit design,trace-buffer based hardware,si,elemental semiconductors,hardware,debugging,data acquisition,data analysis,vectors,real time,registers,data analysis techniques,design flow | Data analysis,Computer science,Data acquisition,Electronic engineering,Real-time computing,Background debug mode interface,Design flow,Integrated circuit design,Software,Silicon debug,Debugging,Embedded system | Conference |
ISSN | ISBN | Citations |
2153-6961 | 978-1-4673-0770-3 | 3 |
PageRank | References | Authors |
0.41 | 24 | 4 |
Name | Order | Citations | PageRank |
|---|---|---|---|
| Yu-Shen Yang | 1 | 92 | 8.23 |
| A. Veneris | 2 | 937 | 67.52 |
| Nicola Nicolici | 3 | 807 | 59.91 |
| Masahiro Fujita | 4 | 186 | 28.83 |