Name
Abstract | ||
|---|---|---|
A new approach for providing tolerance to soft errors in digital circuits is presented. This approach is based on filtering transients at register inputs. It is shown in this paper that it can reduce the error rate due to ionizing radiation to insignificant levels. A comparative analysis of the overhead implied by our approach and alternative existing methods is also given. |
Year | Venue | Keywords |
|---|---|---|
1984 | ITC | ionizing radiation,insignificant level,register input,alternative existing method,digital circuit,error rate,soft error,comparative analysis,new approach,built-in tolerance |
Field | DocType | ISBN |
Digital electronics,Computer science,Word error rate,Filter (signal processing),Real-time computing,Electronic engineering | Conference | 0-8186-0548-0 |
Citations | PageRank | References |
2 | 2.76 | 0 |
Authors | ||
4 | ||
Name | Order | Citations | PageRank |
|---|---|---|---|
| Y. Savaria | 1 | 119 | 26.71 |
| V. K. Agarwal | 2 | 360 | 44.82 |
| Rumin, N. | 3 | 13 | 6.88 |
| J. F. Hayes | 4 | 12 | 3.70 |