Name
Affiliation
Papers
Y. SAVARIA
ECOLE POLYTECH,DEPT ELECT & COMP ENGN,MONTREAL H3C 3A7,QUEBEC,CANADA
34
Collaborators
Citations 
PageRank 
82
119
26.71
Referers 
Referees 
References 
267
379
177
Search Limit
100379
Title
Citations
PageRank
Year
Causal Information Prediction for Analog Circuit Design Using Variable Selection Methods Based on Machine Learning00.342021
RISC-V Barrel Processor for Deep Neural Network Acceleration00.342021
Analog Circuits to Accelerate the Relaxation Process in the Equilibrium Propagation Algorithm00.342020
OTA-Free MASH 2-2 Noise Shaping SAR ADC - System and Design Considerations.00.342020
Self-Adjusting Deadtime Generator for High-Efficiency High-Voltage Switched-Mode Power Amplifiers00.342020
A Prediction Model for Implementing DVS in Single-Rail Bundled-Data Handshake-Free Asynchronous Circuits00.342019
Enhanced Bloom filter utilisation scheme for string matching using a splitting approach.10.362018
A Library-Based Early Soft Error Sensitivity Analysis Technique for SRAM-Based FPGA Design70.772013
A very-high output impedance charge pump for low-voltage low-power PLLs40.442009
A high-level requirements engineering methodology for electronic system-level design00.342007
Soft-error classification and impact analysis on real-time operating systems110.812006
A Metric for Automatic Word-Length Determination of Hardware Datapaths20.412006
Evaluation of a software-based error detection technique by RT-level fault injection00.342006
A system level implementation strategy and partitioning heuristic for LUT-based applications00.342005
Performance Evaluation and Failure Rate Prediction for the Soft Implemented Error Detection Technique10.362004
SIED: software implemented error detection90.642003
Improvement of sensor accuracy in the case of a variable surface reflectance gradient for active laser range finders10.352003
A flexible floating-point format for optimizing data-paths and operators in FPGA based DSPs224.262002
Spatial characterization of process variations via MOS transistor time constants in VLSI and WSI71.231999
Design of Clock Distribution Networks in Presence of Process Variations60.971998
A comparative analysis of fuzzy ART neural network implementations: the advantages of reconfigurable computing00.341998
Design and performance of CMOS TSPC cells for high speed pseudo random testing10.431996
Implementing Fault Injection and Tolerance Mechanisms in Multiprocessor Systems.30.601996
Timing analysis speed-up using a hierarchical and a multimode approach20.411996
Producing Reliable Initialization and Test of Sequential Circuits with Pseudorandom Vectors51.081995
On the design of at-speed testable VLSI circuits00.341995
Equivalence Proofs of Some Yield Modeling Methods for Defect-Tolerant Integrated Circuits10.371995
A new method for testing mixed analog and digital circuits10.361995
Cost analysis of a new algorithmic-based soft-error tolerant architecture.00.341995
A Fast Method to Evaluate the Optimum Number of Spares in Defect-Tolerant Integrated Circuits20.451994
A pragmatic approach to the design of self-testing circuits80.791989
New architectures for fast convolutional encoders and threshold decoders61.031988
Soft-error filtering: A solution to the reliability problem of future VLSI digital circuits173.761986
A design for machines with built-in tolerance to soft errors22.761984