Abstract | ||
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In this paper, a modeling of Electro-Static Discharge (ESD) induced defects and their interactions with a laser beam is undertaken. The aim of this study is to demonstrate the suitability of Photovoltaic Laser Stimulation (PLS) techniques to analyze this kind of defect. The experimental results presented are based on five different samples that were submitted to different stresses. This lead us to point to the ability of the technique to furnish information on the failure mechanism. (C) 2003 Elsevier Ltd. All rights reserved. |
Year | DOI | Venue |
---|---|---|
2003 | 10.1016/S0026-2714(03)00277-4 | Microelectronics Reliability |
Field | DocType | Volume |
Electronic engineering,Laser,Engineering,Optoelectronics,Photovoltaic system | Journal | 43 |
Issue | ISSN | Citations |
9 | 0026-2714 | 0 |
PageRank | References | Authors |
0.34 | 0 | 5 |
Name | Order | Citations | PageRank |
---|---|---|---|
T. Beauchêne | 1 | 3 | 2.40 |
David Trémouilles | 2 | 13 | 8.69 |
D. Lewis | 3 | 36 | 8.96 |
P. Perdu | 4 | 60 | 27.38 |
Pascal Fouillat | 5 | 58 | 14.00 |