Title
Three-Dimensional Chips Can Be Cool: Thermal Study of VeSFET-Based 3-D Chips
Abstract
Thermal management becomes a huge challenge for modern IC designers, especially when chips go 3-D. Vertical slit field-effect transistor (VeSFET) technology provides an alternative thermal-friendly design choice. VeSFET-based chips not only have a much lower power density but also a better vertical thermal conductivity than their CMOS counterparts. For a VeSFET chip with ten stacked dies, the temperature increase is only 30% of that for CMOS-based chip. Assuming the same scaling trend for CMOS and VeSFET, VeSFET 3-D chips can postpone the appearance of dark silicon by three technology nodes compared with CMOS implementations. For VeSFET-based designs, different topologies of transistor arrays may result in different thermal behaviors. We perform thermal characterization of two-transistor array topologies.
Year
DOI
Venue
2015
10.1109/TVLSI.2014.2325551
VLSI) Systems, IEEE Transactions  
Keywords
Field
DocType
3-d,cmos,canvas,thermal,vertical slit field-effect transistor (vesfet),vertical slit field-effect transistor (vesfet).,transistors,thermal management,heating,thermal conductivity,silicon,field effect transistors,cmos integrated circuits,conductivity
Dark silicon,Transistor array,Thermal,Computer science,Thermal management of electronic devices and systems,Chip,Electronic engineering,CMOS,Transistor,Electrical engineering,Thermal conductivity
Journal
Volume
Issue
ISSN
23
5
1063-8210
Citations 
PageRank 
References 
0
0.34
15
Authors
3
Name
Order
Citations
PageRank
Xiang Qiu1233.28
Malgorzata Marek-Sadowska22272213.72
Wojciech Maly31976352.57