Name
Abstract | ||
|---|---|---|
A recursive technique for generating exhaustive patterns is presented. The method is optimal, i.e., in one experiment it covers exhaustively every block of k adjacent inputs in the first 2/sup k/ vectors. Implementation methods based on characteristic functions of test vectors are provided. They include a parallel pattern generator employing an exclusive-or array, and two serial generators that can be easily adopted in a scan-based built-in self-test environment. |
Year | DOI | Venue |
|---|---|---|
1993 | 10.1109/12.260644 | Computers, IEEE Transactions |
Keywords | Field | DocType |
built-in self test,logic testing,characteristic functions,exclusive-or array,parallel pattern generator,recursive pseudoexhaustive test pattern generation,scan-based built-in self-test,serial generators,test vectors | Pattern generation,Logic testing,Digital pattern generator,Computer science,Characteristic function (probability theory),Algorithm,Recursion,Built-in self-test | Journal |
Volume | Issue | ISSN |
42 | 12 | 0018-9340 |
Citations | PageRank | References |
8 | 1.11 | 14 |
Authors | ||
2 | ||
Name | Order | Citations | PageRank |
|---|---|---|---|
| J. Rajski | 1 | 985 | 63.36 |
| Jerzy Tyszer | 2 | 838 | 74.98 |