Name
Year | DOI | Venue |
|---|---|---|
1992 | 10.1109/TEST.1992.527818 | ITC |
Keywords | Field | DocType |
sequential analysis,benchmark testing,computational modeling,sequential circuits | Stuck-at fault,Automatic test pattern generation,Sequential logic,Fault coverage,Computer science,Real-time computing,Electronic engineering,Fault Simulator,Reliability engineering,Benchmark (computing),Fault indicator,Test set | Conference |
ISSN | ISBN | Citations |
1089-3539 | 0-7803-0760-7 | 51 |
PageRank | References | Authors |
3.55 | 7 | 3 |
Name | Order | Citations | PageRank |
|---|---|---|---|
| Elizabeth M. Rudnick | 1 | 867 | 76.37 |
| W. K. Fuchs | 2 | 464 | 45.59 |
| J. H. Patel | 3 | 4577 | 527.59 |