Name
Abstract | ||
|---|---|---|
With the increase in the complexity of VLSI circuit design, logic design errors can occur during synthesis. In this work, we present a method for multiple design error diagnosis and correction. Our approach uses the results of test vector simulation for both error detection and error correction. This makes it applicable to circuits with no global BDD representation. In addition, diagnosis is performed through an implicit enumeration of potentially erroneous lines in an effort to avoid the exponential explosion of the error space. Experimental results on ISCAS'85 benchmark circuits show that our approach can typically detect and correct 1, 2 and 3 errors within seconds of CPU time. |
Year | DOI | Venue |
|---|---|---|
1999 | 10.1109/VTEST.1999.766647 | VTS '99 Proceedings of the 1999 17TH IEEE VLSI Test Symposium |
Keywords | Field | DocType |
VLSI,digital integrated circuits,error correction,fault diagnosis,integrated circuit design,logic CAD,ISCAS'85 benchmark circuits,VLSI circuit design,digital VLSI circuits,error correction,error space,logic design errors,multiple design error diagnosis,test vector simulation | Logic synthesis,Test vector,CPU time,Computer science,Error detection and correction,Electronic engineering,Integrated circuit design,Electronic circuit,Very-large-scale integration,Computer engineering,Benchmark (computing) | Conference |
ISSN | ISBN | Citations |
1093-0167 | 0-7695-0146-X | 11 |
PageRank | References | Authors |
0.80 | 13 | 4 |
Name | Order | Citations | PageRank |
|---|---|---|---|
| A. Veneris | 1 | 937 | 67.52 |
| Srikanth Venkataraman | 2 | 572 | 48.05 |
| Ibrahim N. Hajj | 3 | 572 | 79.52 |
| W. K. Fuchs | 4 | 464 | 45.59 |