Name
Abstract | ||
|---|---|---|
C2BIST (Circular CA BIST) is a Built-In Self Test (BIST) archi- tecture for Sequential Circuits based on Cellular Automata (CA). When CA cells implement suitable rules, this structure shows good test generation capabilities, reaching high Fault Coverage. The main characteristic of this approach is that the same CA is used for both generation and compaction, leading to a trade-off between attained Fault Coverage and area overhead more favor- able than other BIST approaches. On the other side, the main problem is that the circuit, during the test phase, may early enter a loop, reducing the attained Fault Coverage. The paper analyzes this problem and proposes a solution based on the Partial Reset technique, that is able to break cycles b y e xploiting the circuit flip-flops synchronous reset signal with a small area overhead with respect to the basic C2BIST architecture. Experimental re- sults allow a quantitative evaluation of the effectiveness of this approach. |
Year | DOI | Venue |
|---|---|---|
2000 | 10.1109/ISCAS.2000.857030 | Circuits and Systems, 2000. Proceedings. ISCAS 2000 Geneva. The 2000 IEEE International Symposium |
Keywords | Field | DocType |
built-in self test,cellular automata,integrated circuit testing,integrated logic circuits,logic testing,sequential circuits,C2BIST architecture,cellular automata-based BIST architecture,flip-flops,high fault coverage,partial reset technique,sequential circuits,synchronous reset signal,test compaction,test generation capabilities | Automatic test pattern generation,Cellular automaton,Architecture,Sequential logic,Fault coverage,Logic testing,Computer science,Electronic engineering,Self test,Built-in self-test | Conference |
Volume | ISBN | Citations |
1 | 0-7803-5482-6 | 1 |
PageRank | References | Authors |
0.36 | 7 | 3 |
Name | Order | Citations | PageRank |
|---|---|---|---|
| F. Corno | 1 | 602 | 55.65 |
| M. Sonza Reorda | 2 | 1099 | 114.76 |
| G. Squillero | 3 | 330 | 30.36 |