Name
Abstract | ||
|---|---|---|
This paper deals with the diagnosis of faulty embedded RAMs and outlines the solution which is currently under evaluation within STMicroelectronics. The proposed solution exploits a BIST module implementing a March algorithm, defines a wrapper allowing its interface with a TAP controller, and describes a diagnostic procedure running in the external ATE software environment. The approach allows one to test multiple modules in the same chip through a single TAP interface and is compliant with the proposed P1500 standard for Embedded Core Test. Some preliminary experimental results gathered using a sample circuit are reported, showing the effectiveness of the proposed solution in terms of area and time requirements |
Year | DOI | Venue |
|---|---|---|
2001 | 10.1109/ATS.2001.990266 | Asian Test Symposium |
Keywords | Field | DocType |
VLSI,automatic test software,built-in self test,fault diagnosis,integrated circuit testing,integrated memory circuits,logic testing,measurement standards,random-access storage,BIST module,March algorithm,P1500 compliant BIST-based approach,P1500 standard compliance,STMicroelectronics,TAP controller interfacing,diagnostic procedure,embedded RAM diagnosis,embedded core test standard,external ATE software environment,faulty embedded RAMs,multiple modules testing | Control theory,Algorithm design,Computer science,Read-write memory,Electronic engineering,Real-time computing,Exploit,Chip,Software,Very-large-scale integration,Embedded system,Built-in self-test | Conference |
ISSN | ISBN | Citations |
1081-7735 | 0-7695-1378-6 | 7 |
PageRank | References | Authors |
0.74 | 9 | 4 |
Name | Order | Citations | PageRank |
|---|---|---|---|
| D. Appello | 1 | 68 | 7.84 |
| F. Corno | 2 | 602 | 55.65 |
| Giovinetto, M. | 3 | 7 | 0.74 |
| M. Rebaudengo | 4 | 593 | 45.50 |