Name
Abstract | ||
|---|---|---|
A design approach of a Parametric Measurement Unit (PMU) is presented along with integration onto the same Integrated Circuit (IC) with 600MHz Driver, Comparator, and Active Load (DCL). These circuits are necessary components of many Automated Test Equipment (ATE) systems used to test ICs and are often referred to collectively as the Pin Electronics (PE). PMUs are high accuracy and low bandwidth circuits that have to drive a range of capacitive loads. The need for high accuracy requires the use of feedback and high gain operational amplifiers. The tradeoff to be made in these circuits is between accuracy and settling time. Better accuracy requires higher gain which requires more aggressive compensation which increases settling time. A design approach will be proposed that strikes a balance between DC accuracy and settling time. In areas of the circuit that affect the speed of the test path, novel design techniques are used to minimize the output capacitance of the PMU allowing its integration onto the 600MHz DCL. |
Year | DOI | Venue |
|---|---|---|
2011 | 10.1109/ISOCC.2011.6138628 | ISOCC |
Keywords | DocType | ISBN |
uhf amplifiers,uhf integrated circuits,uhf measurement,comparators (circuits),driver circuits,operational amplifiers,units (measurement),ate systems,dcl,pe,pmu design approach,automated test equipment systems,capacitive loads,frequency 600 mhz,high gain operational amplifiers,integrated circuit,parametric measurement unit design approach,pin electronics,ate,pmu,integration,automated test equipment,operational amplifier | Conference | 978-1-4577-0710-0 |
Citations | PageRank | References |
0 | 0.34 | 0 |
Authors | ||
4 | ||
Name | Order | Citations | PageRank |
|---|---|---|---|
| Collins, E. | 1 | 0 | 0.34 |
| In-Seok Jung | 2 | 18 | 5.12 |
| Yong-bin Kim | 3 | 338 | 55.72 |
| Kyung Ki Kim | 4 | 99 | 21.62 |