Title
Diagnosis Methods for Gate Delay Faults with Various Amounts of Delays.
Year
Venue
Field
2016
IPSJ Trans. System LSI Design Methodology
Computer science,Real-time computing,Fault (power engineering),Embedded system
DocType
Volume
Citations 
Journal
9
0
PageRank 
References 
Authors
0.34
6
5
Name
Order
Citations
PageRank
Yoshinobu Higami114027.24
Senling Wang2185.91
Hiroshi Takahashi314824.32
Shin-ya Kobayashi4388.60
Kewal K. Saluja51483141.49