Name
Title | ||
|---|---|---|
An All-Digital Edge Racing True Random Number Generator Robust Against PVT Variations. |
Abstract | ||
|---|---|---|
This paper presents an all-digital true random number generator (TRNG) harvesting entropy from the collapse of two edges injected into one even-stage ring, fabricated in 40 and 180 nm CMOS technologies. A configurable ring and tuning loop provides robustness across a wide range of temperature (-40°C to 120 °C), voltage (0.6 to 0.9 V), process variation, and external attack. The dynamic tuning loop... |
Year | DOI | Venue |
|---|---|---|
2016 | 10.1109/JSSC.2016.2519383 | IEEE Journal of Solid-State Circuits |
Keywords | Field | DocType |
Delays,Entropy,Tuning,Systematics,Frequency measurement,Robustness,Jitter | Computer science,Voltage,Electronic engineering,Robustness (computer science),CMOS,NIST,Randomness tests,Process variation,Jitter,Random number generation | Journal |
Volume | Issue | ISSN |
51 | 4 | 0018-9200 |
Citations | PageRank | References |
8 | 0.63 | 7 |
Authors | ||
3 | ||
Name | Order | Citations | PageRank |
|---|---|---|---|
| Kuiyuan Yang | 1 | 148 | 20.89 |
| David Blaauw | 2 | 8916 | 823.47 |
| Dennis Sylvester | 3 | 5295 | 535.53 |