Name
Title | ||
|---|---|---|
Substrate-noise and random-fluctuations reduction with self-adjusted forward body bias |
Abstract | ||
|---|---|---|
We propose a method of reducing substrate noise and random fluctuations utilizing a self-adjusted forward body bias (SA-FBB) circuit. To achieve this, we designed a test chip that contained an on-chip oscilloscope for detecting dynamic noise from various frequency noise sources, and another test chip that contained 10-M transistors for measuring random fluctuation tendencies. Under SA-FBB conditions, it reduced noise by 69.8% and reduced random fluctuations σ(Ids) by 57.9%. |
Year | DOI | Venue |
|---|---|---|
2005 | 10.1109/CICC.2005.1568601 | IEEE Custom Integrated Circuits Conference |
Keywords | Field | DocType |
random variable | Flicker noise,Computer science,Noise (electronics),Phase noise,Noise figure,Noise temperature,Electronic engineering,Effective input noise temperature,Noise generator,Burst noise | Conference |
Volume | Issue | ISBN |
90-C | 4 | 0-7803-9023-7 |
Citations | PageRank | References |
8 | 0.82 | 2 |
Authors | ||
7 | ||
Name | Order | Citations | PageRank |
|---|---|---|---|
| Yoshihide Komatsu | 1 | 26 | 5.22 |
| Koichiro Ishibashi | 2 | 34 | 8.76 |
| Masaharu Yamamoto | 3 | 8 | 0.82 |
| Toshiro Tsukada | 4 | 20 | 4.74 |
| Kenji Shimazaki | 5 | 51 | 8.49 |
| Mitsuya Fukazawa | 6 | 25 | 5.01 |
| Makoto Nagata | 7 | 285 | 76.47 |