Title
Embedded deterministic test points for compact cell-aware tests
Abstract
The introduction of FinFET technology has accelerated the adoption of patterns that target cell internal defects such as cell-aware tests. Even though cell-aware tests can replace stuck-at and transition patterns from the screening point of view, we have to address the increase in test data volume. This combined with the growing gate counts enabled by new technology nodes is driving the need for even greater compression levels. In this paper, we present a novel test points technology designed to reduce deterministic pattern counts for cell-aware tests. The technology is based on identification and resolution of conflicts across internal signals allowing ATPG to significantly increase the number of faults targeted by a single pattern. Experimental results on a number of industrial designs with test compression demonstrate that the proposed test points are effective in achieving, on average, a 3×–4× multiplicative increase in compression for 1-cycle and 2-cycle cell-aware patterns.
Year
DOI
Venue
2015
10.1109/TEST.2015.7342383
2015 IEEE International Test Conference (ITC)
Keywords
Field
DocType
compact cell-aware tests,embedded deterministic test points,FinFET technology,cell internal defects,growing gate counts,compression levels,test points technology,deterministic pattern counts,internal signals,ATPG,1-cycle cell-aware patterns,2-cycle cell-aware patterns,automatic test pattern generation
Automatic test pattern generation,Compression (physics),Logic gate,Multiplicative function,Computer science,Real-time computing,Electronic engineering,Test data,Test compression,Deterministic testing
Conference
ISSN
Citations 
PageRank 
1089-3539
7
0.52
References 
Authors
19
10
Name
Order
Citations
PageRank
Cesar Acero170.52
Derek Feltham270.52
Friedrich Hapke324414.61
Elham Moghaddam4797.05
Nilanjan Mukherjee580157.26
Vidya Neerkundar670.52
Marek J. Patyra7223.99
Janusz Rajski82460201.28
Jerzy Tyszer983874.98
Justyna Zawada10203.48