Title
All-Region Statistical Model for Delay Variation Based on Log-Skew-Normal Distribution.
Abstract
In this paper, we propose a single probability density function for the distributions of the delay in the presence of the process variation for different regions of operation. The delay variation model is inspired by considering the analytical current models for each operating region. Based on these models, we suggest using the log-skew-normal distribution for modeling the delay variation for a wi...
Year
DOI
Venue
2016
10.1109/TCAD.2015.2511148
IEEE Transactions on Computer-Aided Design of Integrated Circuits and Systems
Keywords
Field
DocType
Delays,Threshold voltage,Integrated circuit modeling,Probability density function,Standards,Gaussian distribution,Shape
Exponential-logarithmic distribution,Normal-gamma distribution,Skew normal distribution,Distribution fitting,Electronic engineering,Three-point estimation,Half-normal distribution,Exponential distribution,Lévy distribution,Mathematics
Journal
Volume
Issue
ISSN
35
9
0278-0070
Citations 
PageRank 
References 
4
0.45
7
Authors
4
Name
Order
Citations
PageRank
Hadi Ahmadi Balef140.45
Mehdi Kamal218930.41
Ali Afzali-kusha336554.65
Massoud Pedram478011211.32