Title | ||
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All-Region Statistical Model for Delay Variation Based on Log-Skew-Normal Distribution. |
Abstract | ||
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In this paper, we propose a single probability density function for the distributions of the delay in the presence of the process variation for different regions of operation. The delay variation model is inspired by considering the analytical current models for each operating region. Based on these models, we suggest using the log-skew-normal distribution for modeling the delay variation for a wi... |
Year | DOI | Venue |
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2016 | 10.1109/TCAD.2015.2511148 | IEEE Transactions on Computer-Aided Design of Integrated Circuits and Systems |
Keywords | Field | DocType |
Delays,Threshold voltage,Integrated circuit modeling,Probability density function,Standards,Gaussian distribution,Shape | Exponential-logarithmic distribution,Normal-gamma distribution,Skew normal distribution,Distribution fitting,Electronic engineering,Three-point estimation,Half-normal distribution,Exponential distribution,Lévy distribution,Mathematics | Journal |
Volume | Issue | ISSN |
35 | 9 | 0278-0070 |
Citations | PageRank | References |
4 | 0.45 | 7 |
Authors | ||
4 |
Name | Order | Citations | PageRank |
---|---|---|---|
Hadi Ahmadi Balef | 1 | 4 | 0.45 |
Mehdi Kamal | 2 | 189 | 30.41 |
Ali Afzali-kusha | 3 | 365 | 54.65 |
Massoud Pedram | 4 | 7801 | 1211.32 |