Name
Papers
Collaborators
ALI AFZALI-KUSHA
120
169
Citations 
PageRank 
Referers 
365
54.65
924
Referees 
References 
1779
984
Search Limit
1001000
Title
Citations
PageRank
Year
Distributing DNN training over IoT edge devices based on transfer learning00.342022
An Adaptive Memory-Side Encryption Method for Improving Security and Lifetime of PCM-Based Main Memory00.342022
Optimum distribution of seismic energy dissipation devices using neural network and fuzzy inference system00.342021
Res-DNN: A Residue Number System-Based DNN Accelerator Unit50.452020
Block-Based Carry Speculative Approximate Adder for Energy-Efficient Applications20.372020
Low-Power Data Encoding/Decoding for Energy-Efficient Static Random Access Memory Design00.342019
An Energy-Efficient, Yet Highly-Accurate, Approximate Non-Iterative Divider10.372018
TheSPoT: Thermal Stress-Aware Power and Temperature Management for Multiprocessor Systems-on-Chip.100.592018
Toward Approximate Computing for Coarse-Grained Reconfigurable Architectures.10.482018
LETAM: A low energy truncation-based approximate multiplier.20.392017
An energy and area efficient yet high-speed square-root carry select adder structure.20.402017
All-Region Statistical Model for Delay Variation Based on Log-Skew-Normal Distribution.40.452016
High-Speed and Energy-Efficient Carry Skip Adder Operating Under a Wide Range of Supply Voltage Levels30.422016
Seerad: A High Speed Yet Energy-Efficient Rounding-Based Approximate Divider40.482016
Hybrid TFET-MOSFET circuits: An approach to design reliable ultra-low power circuits in the presence of process variation10.352016
Yield and Speedup Improvements in Extensible Processors by Allocating Extra Cycles to Some Custom Instructions.00.342016
Power and energy reduction of racetrack-based caches by exploiting shared shift operations00.342016
Read static noise margin aging model considering SBD and BTI effects for FinFET SRAMs.00.342016
A thermal stress-aware algorithm for power and temperature management of MPSoCs10.372015
Dynamic Flip-Flop Conversion: A Time-Borrowing Method for Performance Improvement of Low-Power Digital Circuits Prone to Variations70.502015
Workload and temperature dependent evaluation of BTI-induced lifetime degradation in digital circuits20.372015
High-performance and high-yield 5 nm underlapped FinFET SRAM design using P-type access transistors00.342015
Design of NBTI-resilient extensible processors10.352015
OPLE: A Heuristic Custom Instruction Selection Algorithm Based on Partitioning and Local Exploration of Application Dataflow Graphs10.362015
CSAM: A clock skew-aware aging mitigation technique.20.382015
A near-threshold 7T SRAM cell with high write and read margins and low write time for sub-20 nm FinFET technologies.00.342015
A heuristic machine learning-based algorithm for power and thermal management of heterogeneous MPSoCs30.422015
Simultaneous power control and power management algorithm with sector-shaped topology for wireless sensor networks10.362015
A Finfet Sram Cell Design With Bti Robustness At High Supply Voltages And High Yield At Low Supply Voltages20.362015
Improving efficiency of extensible processors by using approximate custom instructions60.492014
Implementation-aware selection of the custom instruction set for extensible processors.10.372014
Data Encoding Techniques for Reducing Energy Consumption in Network-on-Chip130.572014
Robust FinFET SRAM design based on dynamic back-gate voltage adjustment.90.812014
Impact of Process Variations on Speedup and Maximum Achievable Frequency of Extensible Processors20.392014
Dynamic Flip-Flop conversion to tolerate process variation in low power circuits30.432014
Capturing and mitigating the NBTI effect during the design flow for extensible processors10.342013
Robust polysilicon gate FinFET SRAM design using dynamic back-gate bias10.392013
Considering the effect of process variations during the ISA extension design flow20.362013
Self-Impact Of Nbti Effect On The Degradation Rate Of Threshold Voltage In Pmos Transistors10.372013
Modeling symmetrical independent gate FinFET using predictive technology model20.402013
An analytical model for read static noise margin including soft oxide breakdown, negative and positive bias temperature instabilities.20.452013
A new merit function for custom instruction selection under an area budget constraint10.402013
Statistical estimation of leakage power dissipation in nano-scale complementary metal oxide semiconductor digital circuits using generalised extreme value distribution.20.432012
Adaptive Input-Output Selection Based On-Chip Router Architecture00.342012
MEA: an energy efficient algorithm for dense sector-based wireless sensor networks.160.492012
High-performance low-leakage regions of nano-scaled CMOS digital gates under variations of threshold voltage and mobility30.482012
An architecture-level approach for mitigating the impact of process variations on extensible processors100.572012
HACS: A novel cost aware paradigm promising fault tolerance on mesh-based network on chip architecture00.342012
An accurate analytical I-V model for sub-90-nm MOSFETs and its application to read static noise margin modeling00.342012
Modeling read SNM considering both soft oxide breakdown and negative bias temperature instability.20.462012
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