Name
Title | ||
|---|---|---|
A Novel Framework to Estimate the Path Delay Variability On the Back of an Envelope via the Fan-Out-of-4 Metric. |
Abstract | ||
|---|---|---|
In this paper, a novel framework is introduced to estimate the max-delay variability in logic paths due to variations in a back-of-the-envelope fashion, thus allowing quick evaluation of the additional cycle time margin imposed by random (local) variations. The framework provides the designer with a deep insight into the main variability contributions, and the improvements allowed by prospective d... |
Year | DOI | Venue |
|---|---|---|
2017 | 10.1109/TCSI.2017.2687059 | IEEE Transactions on Circuits and Systems I: Regular Papers |
Keywords | Field | DocType |
Delays,Logic gates,Transistors,Standards,Monte Carlo methods,Capacitance | Monte Carlo method,FO4,Logic gate,Design closure,Voltage,Electronic engineering,Transistor,Fan-out,Very-large-scale integration,Mathematics | Journal |
Volume | Issue | ISSN |
64 | 8 | 1549-8328 |
Citations | PageRank | References |
4 | 0.41 | 22 |
Authors | ||
3 | ||
Name | Order | Citations | PageRank |
|---|---|---|---|
| Massimo Alioto | 1 | 706 | 88.98 |
| giuseppe scotti | 2 | 308 | 39.14 |
| A. Trifiletti | 3 | 433 | 63.29 |