Paper Info
Title
SEU impact in processor's control-unit: Preliminary results obtained for LEON3 soft-core
Abstract
The miniaturization issues from the advanced integrated circuit manufacturing technologies lead to increase the probabilities of single node upset and multiple upsets errors of neighbor nodes. The study of such conjecture is mandatory to specify the protection requirements. This paper deals with the study of such single and multiple errors due to the impact of a single particle in the control unit of complex devices such as processors. Because the layout of the studied device cannot be anticipated, the node's neighborhood is thus unknown. To deal with this issue, this work presents the results of both exhaustive and random fault-injection experiments performed at register transfer level (RTL) and targeting the control bits of LEON3 processor. Fault injection is achieved by means an automatic netlist fault injection tool called NETFI-2.
Year
DOI
Venue
2017
10.1109/LATW.2017.7906763
2017 18th IEEE Latin American Test Symposium (LATS)
Keywords
Field
DocType
Single Event Upset,Multiple Cell Upset,Fault injection,Control unit,Multiple nodes faults,Register Transfer Level,Leon3
Netlist,Field-programmable gate array,Upset,Control unit,Soft core,Register-transfer level,Miniaturization,Engineering,Fault injection,Embedded system
Conference
ISBN
Citations 
PageRank 
978-1-5386-0416-8
2
0.45
References 
Authors
10
4
Name
Order
Citations
PageRank
Thierry Bonnoit162.27
Alexandre Coelho231.16
Nacer-Eddine Zergainoh312919.39
Raoul Velazco412419.48