Name
Title | ||
|---|---|---|
A 1.02nW PMOS-only, trim-free current reference with 282ppm/°C from −40°C to 120°C and 1.6% within-wafer inaccuracy |
Abstract | ||
|---|---|---|
A 1.02nW current reference is designed with only PMOS transistors, thereby providing inherently low process variation and enabling trim-free operation. Thirty-two measured chips from 5 corner wafers in 180nm CMOS technology show an untrimmed within-wafer spread (σ/μ) of 1.6% and across-corner wafer-to-wafer spread of ±4.7%. The measured average temperature coefficient is 282ppm/°C from -40°C to 120°C while generating a 35nA reference current. Total untrimmed uncertainty due to variations of process, voltage, and temperature is about 8.8%. |
Year | DOI | Venue |
|---|---|---|
2017 | 10.1109/ESSCIRC.2017.8094515 | ESSCIRC 2017 - 43rd IEEE European Solid State Circuits Conference |
Keywords | Field | DocType |
within-wafer inaccuracy,PMOS transistors,within-wafer spread,trim-free current reference,CMOS technology,corner wafers,across-corner wafer-to-wafer spread,power 1.02 nW,size 180.0 nm,current 35.0 nA,temperature -40.0 degC to 120.0 degC | Wafer,Computer science,Voltage,Temperature coefficient,CMOS,Electronic engineering,Process variation,Transistor,MOSFET,PMOS logic | Conference |
ISBN | Citations | PageRank |
978-1-5090-5026-0 | 0 | 0.34 |
References | Authors | |
8 | 5 | |
Name | Order | Citations | PageRank |
|---|---|---|---|
| Qing Dong | 1 | 95 | 12.29 |
| Inhee Lee | 2 | 275 | 33.89 |
| Kuiyuan Yang | 3 | 148 | 20.89 |
| David Blaauw | 4 | 8916 | 823.47 |
| Dennis Sylvester | 5 | 5295 | 535.53 |