Abstract | ||
---|---|---|
This paper presents a novel single event transient (SET) measurement circuit in SRAM-based field programmable gate arrays (FPGAs). Experimental results demonstrate that the new pulse detector is able to on-chip measure bipolar pulses with a detection limit of near 150 ps, compared with existing pulse detectors, detection capability and detection precision are effectively improved. |
Year | DOI | Venue |
---|---|---|
2017 | 10.1587/elex.14.20170210 | IEICE ELECTRONICS EXPRESS |
Keywords | Field | DocType |
single event transient, pulse detector, on-chip measure, SRAM-based FPGAs | Computer science,Field-programmable gate array,Static random-access memory,Electronic engineering,Detector | Journal |
Volume | Issue | ISSN |
14 | 12 | 1349-2543 |
Citations | PageRank | References |
1 | 0.40 | 4 |
Authors | ||
8 |
Name | Order | Citations | PageRank |
---|---|---|---|
Xiumin Xu | 1 | 7 | 3.24 |
Huaguo Liang | 2 | 216 | 33.27 |
Zhengfeng Huang | 3 | 84 | 30.14 |
Cuiyun Jiang | 4 | 20 | 3.93 |
Yingchun Lu | 5 | 3 | 1.20 |
Aibin Yan | 6 | 29 | 6.78 |
Tianming Ni | 7 | 26 | 10.23 |
Maoxiang Yi | 8 | 28 | 9.14 |