Name
Title | ||
|---|---|---|
Discrimination Of A Resistive Open Using Anomaly Detection Of Delay Variation Induced By Transitions On Adjacent Lines |
Abstract | ||
|---|---|---|
Small delay caused by a resistive open is difficult to test since circuit delay varies depending on various factors such as process variations and crosstalk even in fault-free circuits. We consider the problem of discriminating a resistive open by anomaly detection using delay distributions obtained by the effect of various input signals provided to adjacent lines. We examined the circuit delay in a fault-free circuit and a faulty circuit by applying electromagnetic simulator and circuit simulator for a line structure with adjacent lines under consideration of process variations. The effectiveness of the method that discriminates a resistive open is shown for the results obtained by the simulation. |
Year | DOI | Venue |
|---|---|---|
2017 | 10.1587/transfun.E100.A.2842 | IEICE TRANSACTIONS ON FUNDAMENTALS OF ELECTRONICS COMMUNICATIONS AND COMPUTER SCIENCES |
Keywords | Field | DocType |
resistive open, small delay fault, adjacent line, delay variation, anomaly detection | Anomaly detection,Discrete mathematics,Computational physics,Resistive touchscreen,Mathematics | Journal |
Volume | Issue | ISSN |
E100A | 12 | 0916-8508 |
Citations | PageRank | References |
0 | 0.34 | 16 |
Authors | ||
5 | ||
Name | Order | Citations | PageRank |
|---|---|---|---|
| Hiroyuki Yotsuyanagi | 1 | 70 | 19.04 |
| Kotaro Ise | 2 | 0 | 0.34 |
| Masaki Hashizume | 3 | 98 | 27.83 |
| Yoshinobu Higami | 4 | 140 | 27.24 |
| H. Takahashi | 5 | 18 | 3.94 |