Title
Analysis of Body Bias and RTN-Induced Frequency Shift of Low Voltage Ring Oscillators in FDSOI Technology
Abstract
Electronic circuits powered at ultra low voltages (500 mV and below) are desirable for their low energy and power consumption. However, RTN (Random Telegraph Noise)-induced threshold voltage variations become very significant at such supply voltages. This paper evaluates the impact of RTN on additional jitter in a ring oscillator. Since FDSOI allows a large range of body bias voltages, this work studies how body biasing affects the oscillation frequency but also the jitter effects. The impact of RTN in NMOS and PMOS devices on frequency as well as the levels of supplementary jitter introduced by RTN are evaluated and compared with classical device noise.
Year
DOI
Venue
2018
10.1109/PATMOS.2018.8464145
2018 28th International Symposium on Power and Timing Modeling, Optimization and Simulation (PATMOS)
Keywords
Field
DocType
Ultra-Low Voltage,FDSOI,Body Bias,RTN,Jitter,Ring Oscillators
Ring oscillator,NMOS logic,Computer science,Electronic engineering,Low voltage,Jitter,PMOS logic,Optoelectronics,Threshold voltage,Low-power electronics,Biasing
Conference
ISSN
ISBN
Citations 
2474-5456
978-1-5386-6366-0
0
PageRank 
References 
Authors
0.34
2
12