Name
Abstract | ||
|---|---|---|
This paper describes a novel approach to a true random number generator (TRNG) using SRAM circuits. The principles of operation are described in the context of past work on integrated circuit TRNGs. The required modifications to standard SRAM arrays are minor and have little impact on the area. Experimental results from large 1-Mbit SRAM arrays fabricated on a 55-nm process using the foundry suppl... |
Year | DOI | Venue |
|---|---|---|
2018 | 10.1109/TVLSI.2018.2840049 | IEEE Transactions on Very Large Scale Integration (VLSI) Systems |
Keywords | Field | DocType |
Random access memory,Entropy,NIST,Transistors,Very large scale integration | Computer science,Electronic engineering,Static random-access memory,Randomness tests,NIST,Electronic circuit,Random number generation,Very-large-scale integration,Integrated circuit,Randomness | Journal |
Volume | Issue | ISSN |
26 | 10 | 1063-8210 |
Citations | PageRank | References |
1 | 0.35 | 0 |
Authors | ||
3 | ||
Name | Order | Citations | PageRank |
|---|---|---|---|
| Lawrence T. Clark | 1 | 155 | 33.27 |
| Sai Bharadwaj Medapuram | 2 | 1 | 1.02 |
| Divya Kiran Kadiyala | 3 | 1 | 0.35 |