Title
Addressing Failure and Aging Degradation in MRAM/MeRAM-on-FDSOI Integration.
Abstract
In this paper, we discuss the potential foundry announced integration of magnetic random access memory (MRAM) on fully depleted silicon-on-insulator (FDSOI). The spin transfer torque magnetic tunnel junction (STT-MTJ) and the next-generation voltage-controlled magnetic anisotropy MTJ are separately integrated into a 28-nm FDSOI process as the MRAM or magnetoelectric random access memory (MeRAM)-on...
Year
DOI
Venue
2019
10.1109/TCSI.2018.2854277
IEEE Transactions on Circuits and Systems I: Regular Papers
Keywords
Field
DocType
Silicon-on-insulator,Magnetic tunneling,Aging,Transistors,Writing,Perpendicular magnetic anisotropy
Silicon on insulator,Electronic engineering,Magnetoresistive random-access memory,CMOS,Process variation,Tunnel magnetoresistance,Spin-transfer torque,Transistor,Mathematics,Random access
Journal
Volume
Issue
ISSN
66
1
1549-8328
Citations 
PageRank 
References 
0
0.34
0
Authors
7
Name
Order
Citations
PageRank
Hao Cai16021.94
You Wang2299.66
Lirida A. B. Naviner38326.52
Xinning Liu484.02
Weiwei Shan52212.51
Jun Yang658839.42
Weisheng Zhao7730105.43