Title
A 16-bit 2.0-ps Resolution Two-Step TDC in 0.18-µm CMOS Utilizing Pulse-Shrinking Fine Stage With Built-In Coarse Gain Calibration.
Abstract
This paper proposes a time-to-digital converter (TDC) that achieves wide input range and fine time resolution at the same time. The proposed TDC utilizes pulse-shrinking (PS) scheme in the second stage for a fine resolution and two-step (TS) architecture for a wide range. The proposed PS TDC prevents an undesirable nonuniform shrinking rate issue in the conventional PS TDCs by utilizing a built-in...
Year
DOI
Venue
2019
10.1109/TVLSI.2018.2867505
IEEE Transactions on Very Large Scale Integration (VLSI) Systems
Keywords
Field
DocType
Delays,Signal resolution,Jitter,Very large scale integration,Calibration,Transistors
Computer science,16-bit,Electronic engineering,CMOS,Jitter,Transistor,Very-large-scale integration,Calibration,Offset (computer science),Radio propagation
Journal
Volume
Issue
ISSN
27
1
1063-8210
Citations 
PageRank 
References 
0
0.34
0
Authors
5
Name
Order
Citations
PageRank
Ryuichi Enomoto100.34
Tetsuya Iizuka29233.22
Takehisa Koga310.72
Toru Nakura49231.27
kunihiro asada527378.26