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X. GARROS
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Name
Affiliation
Papers
X. GARROS
CEA-LETI, 17 rue des Martyrs, 38054 Grenoble, France
6
Collaborators
Citations
PageRank
34
7
3.00
Referers
Referees
References
29
11
2
Publications (6 rows)
Collaborators (34 rows)
Referers (29 rows)
Referees (11 rows)
Title
Citations
PageRank
Year
Impact of Passive & Active Load Gate Impedance on Breakdown Hardness in 28nm FDSOI Technology
0
0.34
2019
A novel insight of pBTI degradation in GaN-on-Si E-mode MOSc-HEMT
1
0.63
2018
Superior performance and Hot Carrier reliability of Strained FDSOI nMOSFETs for advanced CMOS technology nodes
0
0.34
2014
Process dependence of BTI reliability in advanced HK MG stacks
2
0.62
2009
Initial and PBTI-induced traps and charges in Hf-based oxides/TiN stacks
4
0.74
2007
Hot-Carrier Reliability for Si and SiGe HBTs: Aging Procedure, Extrapolation Model Limitations and Applications
0
0.34
2001
1